4 edition of Characterization of SiGe/Ge heterostructures and graded layers using variable angle spectroscopic ellipsometry found in the catalog.
Characterization of SiGe/Ge heterostructures and graded layers using variable angle spectroscopic ellipsometry
by National Aeronautics and Space Administration, National Technical Information Service, distributor in [Washington, D.C, Springfield, Va
Written in English
|Statement||A.R. Heyd ... [et al.].|
|Series||NASA-TM -- 111685., NASA technical memorandum -- 111685.|
|Contributions||Heyd, A. R., United States. National Aeronautics and Space Administration.|
|The Physical Object|
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