4 edition of Characterization of SiGe/Ge heterostructures and graded layers using variable angle spectroscopic ellipsometry found in the catalog.
Characterization of SiGe/Ge heterostructures and graded layers using variable angle spectroscopic ellipsometry
Published
1996
by National Aeronautics and Space Administration, National Technical Information Service, distributor in [Washington, D.C, Springfield, Va
.
Written in English
Edition Notes
| Statement | A.R. Heyd ... [et al.]. |
| Series | NASA-TM -- 111685., NASA technical memorandum -- 111685. |
| Contributions | Heyd, A. R., United States. National Aeronautics and Space Administration. |
| The Physical Object | |
|---|---|
| Format | Microform |
| Pagination | 1 v. |
| ID Numbers | |
| Open Library | OL17834454M |
| OCLC/WorldCa | 39647979 |
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